Morphological and Electrical Characterization of Nickel Oxide-Ytrria Stabilize Zirconia Thin Film Prepared Using Sol Gel Dip Coating Method

  • Nor Hidayah Amin Department of Physics, Faculty of Science, Universiti Teknologi Malaysia
  • Rosnita Muhammad Department of Physics, Faculty of Science, Universiti Teknologi Malaysia
  • Wan Nurulhuda Wan Shamsuri Department of Physics, Faculty of Science, Universiti Teknologi Malaysia
Keywords: Nickel Oxide-Yttria Stabilize Zirconia, dip coating, Atomic Force Microscopy, conductivity, solid oxide fuel cell

Abstract

Considerable attention has been focused on solid oxide fuel cells (SOFCs) due to their potential for the most promising technologies for very high-efficiency electric energy. In the present work, the structure and electrical performance of NiO-YSZ anode, which were annealed at 600⁰C were investigated.  The dip-coating technique was used for preparing NiO-YSZ thin films on glass substrate. Atomic force microscopy (AFM) was used to observe the morphological structure and four point probe was used in order to analyze the electrical performance of the annealed films. The analysis showed that the NiO-YSZ anode annealed at 600⁰C was successfully fabricated for SOFCs applications, due to minimum roughness and the minimum conductivity which is 0.05604, 0.02061, 0.01443 S cm−1 for the 1, 2 and 3 layers, respectively. Therefore, this NiO-YSZ anode is promising the future generation of SOFCs.
Published
2017-12-26
How to Cite
Amin, N. H., Muhammad, R., & Wan Shamsuri, W. N. (2017). Morphological and Electrical Characterization of Nickel Oxide-Ytrria Stabilize Zirconia Thin Film Prepared Using Sol Gel Dip Coating Method. Journal of Science and Technology, 9(3). Retrieved from https://publisher.uthm.edu.my/ojs/index.php/JST/article/view/2041