HO, Yeap Kim; AHMAD, Ibrahim; SULONG, Muhammad Suhaimi. Characterization of a 0.14 μm Submicron NMOS with Silvaco TCAD Simulator. Journal of Science and Technology, [S. l.], v. 1, n. 1, 2009. Disponível em: https://publisher.uthm.edu.my/ojs/index.php/JST/article/view/264.. Acesso em: 18 jul. 2024.