ONG, Pauline; WU, Jia Hang; JAMIT, Rexca; CHEONG, Cheng Kit. Egg Defects Detection Using Bidirectional Long Short-Term Memory Network. Journal of Advanced Industrial Technology and Application, [S. l.], v. 6, n. 2, p. 59–70, 2025. Disponível em: https://publisher.uthm.edu.my/ojs/index.php/jaita/article/view/23619. Acesso em: 11 mar. 2026.