PUSPPANATHAN, J.; MOHMAD AMERAN, H. L.; HAMZAH, A. A.; ABDUL RAHIM, R.; ABDULLAH, F. A. P.; NGADIMAN, N. H. A.; WAHAB, Y. A. Sensitivity Mapping for Electrical Tomography Using Finite Element Method. International Journal of Integrated Engineering, [S. l.], v. 10, n. 4, 2018. Disponível em: https://publisher.uthm.edu.my/ojs/index.php/ijie/article/view/2183. Acesso em: 17 aug. 2022.