ATALLA, Yousif; MAMAT, Mohamad Hafiz; HASHIM, Yasir. Characterization and Optimization of Si-FinFET Structure Based on Gate Length and Working Temperature. International Journal of Integrated Engineering, [S. l.], v. 17, n. 2, p. 177–185, 2025. Disponível em: https://publisher.uthm.edu.my/ojs/index.php/ijie/article/view/17145. Acesso em: 22 jul. 2026.