Ho, Yeap Kim, Ibrahim Ahmad, and Muhammad Suhaimi Sulong. “Characterization of a 0.14 μm Submicron NMOS With Silvaco TCAD Simulator”. Journal of Science and Technology 1, no. 1 (1). Accessed June 16, 2021. https://publisher.uthm.edu.my/ojs/index.php/JST/article/view/264.